| Call for Papers |
JOINT IAPR INTERNATIONAL WORKSHOPS ON
Structural and Syntactic Pattern Recognition
(SSPR 2006)
and
Statistical Techniques in Pattern Recognition
(SPR 2006) 数据挖掘研究院
Hong Kong, China, August 17-19, 2006
Aim of the workshops
The International Association for Pattern Recognition (IAPR) and its committees on Statistical PR (TC1) and Syntactical and Structural PR (TC2) will organize the next joint workshops at the Hong Kong University of Science and Technology (HKUST) prior to the 18th International Conference on Pattern Recognition, ICPR 2006, which will also be held in Hong Kong. The joint workshops aim at promoting interaction and collaboration not only among researchers working directly in areas covered by TC1 and TC2 but also among those in other fields who use statistical, structural or syntactic techniques extensively. We welcome mathematicians, statisticians, researchers in machine learning and practitioners alike who, at present, work outside the pattern recognition community.Topics of interest cover all aspects of the major paradigms of pattern recognition; for a non-exhaustive list, see the SPR and/or SSPR pages.
Format of the workshops
The workshops will comprise of invited talks, oral and poster presentations, and panel discussions. In addition, the SSPR workshop will have a special session called Graph Based Methods in Structural Pattern Recognition, co-organized by the Technical Committee on Graph Based Representations (TC15). Accepted papers will appear in the proceedings, which will be published by Springer in the Lecture Notes in Computer Science series, and will be distributed to all participants during the workshops.
Submission of papers
Papers for both workshops should describe original and unpublished work related to the topic areas of SPR, SSPR or closely related ones. Full papers may be up to 9 A4 pages long and should be prepared according to the layout of Springer-Verlag. All manuscripts will be reviewed by at least two members of the SPR or SSPR program committee. Instructions for preparation and electronic submission will be available shortly on this website.18th International Conference of Pattern Recognition, ICPR 2006
